X-Ray Diffraction (XRD)

Facility Overview

X-ray diffraction (XRD) is a method for probing the space between atomic planes that make up crystalline materials. In doing so, the technique allows for identification of materials based on their crystal structure and lattice spacings. XRD is primarily used for phase identification of minerals and metals, and also finds some applications with polymers, thin films, and nanomaterials. The EMES is equipped with a Malvern Empyrean (3rd Gen.) XRD that is equipped with a cobalt source, automated optics, a Pixcel3D detector, and 3-axis cradle stage.

Measurements are primarily done in powder mode but can also include grazing incidence measurements of thin films and residual stress by chi-tilting.

The system also has an Anton Parr DCS500 stage capable of in-situ measurements from –180 °C to 500 °C, with electrical connections for simultaneous in-situ electrical measurements. This stage mounts to the 3-axes cradle, allowing for in-situ residual stress measurements as well.